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ORCIDSasikumar Cherubal
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2010 – 2019
- 2010
[j3]Ganesh Srinivasan, Abhijit Chatterjee, Sasikumar Cherubal, Pramodchandran N. Variyam:
Production Realization of MTPR Test on Low-Cost ATE for OFDM Based Communication Devices. J. Electron. Test. 26(4): 405-417 (2010)
2000 – 2009
- 2007
- [j2]Ramakrishna Voorakaranam, Selim Sermet Akbay, Soumendu Bhattacharya, Sasikumar Cherubal, Abhijit Chatterjee:
Signature Testing of Analog and RF Circuits: Algorithms and Methodology. IEEE Trans. Circuits Syst. I Regul. Pap. 54-I(5): 1018-1031 (2007) - 2006
- [c17]Venkat Kalyanaraman, Bruce C. Kim, Pramodchandran N. Variyam, Sasikumar Cherubal:
DIBPro: Automatic Diagnostic Program Generation Tool. ITC 2006: 1-8 - 2005
- [c16]Sasikumar Cherubal:
Challenges in Next Generation Mixed-Signal IC Production Testing. Asian Test Symposium 2005: 466 - [c15]Ganesh Srinivasan, Sasikumar Cherubal, Pramodchandran N. Variyam, Melese Teklu, C. P. Wang, David Guidry, Abhijit Chatterjee:
Accurate measurement of multi-tone power ratio (MTPR) of ADSL devices using low cost testers. ETS 2005: 68-73 - 2004
- [c14]Ganesh Srinivasan, Soumendu Bhattacharya, Sasikumar Cherubal, Abhijit Chatterjee:
Efficient Test Strategy for TDMA Power Amplifiers Using Transient Current Measurements: Uses and Benefit. DATE 2004: 280-285 - [c13]Soumendu Bhattacharya, Ganesh Srinivasan, Sasikumar Cherubal, Abhijit Chatterjee:
Test Time Reduction for ACPR Measurement of Wireless Transceivers Using Periodic Bit-Stream Sequences. DELTA 2004: 372-377 - [c12]Sasikumar Cherubal, Ramakrishna Voorakaranam, Abhijit Chatterjee, John McLaughlin, Jason L. Smith, David M. Majernik:
Concurrent RF Test Using Optimized Modulated RF Stimuli. VLSI Design 2004: 1017-1022 - [c11]Soumendu Bhattacharya, Ganesh Srinivasan, Sasikumar Cherubal, Achintya Halder, Abhijit Chatterjee:
System-level Testing of RF Transmitter Specifications Using Optimized Periodic Bitstreams. VTS 2004: 229-236 - 2003
- [c10]Ramakrishna Voorakaranam, Randy Newby, Sasikumar Cherubal, Bob Cometta, Thomas Kuehl, David M. Majernik, Abhijit Chatterjee:
Production Deployment of a Fast Transient Testing Methodology for Analog Circuits : Case Study and Results. ITC 2003: 1174-1181 - 2002
- [j1]Pramodchandran N. Variyam, Sasikumar Cherubal, Abhijit Chatterjee:
Prediction of analog performance parameters using fast transienttesting. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 21(3): 349-361 (2002) - [c9]Ramakrishna Voorakaranam, Sasikumar Cherubal, Abhijit Chatterjee:
A Signature Test Framework for Rapid Production Testing of RF Circuits. DATE 2002: 186-191 - 2001
- [c8]Sasikumar Cherubal, Abhijit Chatterjee:
Test generation based diagnosis of device parameters for analog circuits. DATE 2001: 596-602 - [c7]Sasikumar Cherubal, Abhijit Chatterjee:
A high-resolution jitter measurement technique using ADC sampling. ITC 2001: 838-847 - 2000
- [c6]Sasikumar Cherubal, Abhijit Chatterjee:
Test generation for fault isolation in analog circuits using behavioral models. Asian Test Symposium 2000: 19-24 - [c5]Sasikumar Cherubal, Abhijit Chatterjee:
Optimal INL/DNL testing of A/D converters using a linear model. ITC 2000: 358-366 - [c4]Sasikumar Cherubal, Abhijit Chatterjee:
An Efficient Hierarchical Fault Isolation Technique for Mixed-Signal Boards. VLSI Design 2000: 550-555
1990 – 1999
- 1999
- [c3]Sasikumar Cherubal, Abhijit Chatterjee:
Parametric Fault Diagnosis for Analog Systems Using Functional Mapping. DATE 1999: 195- - [c2]Sasikumar Cherubal, Abhijit Chatterjee:
A Methodology for Efficient Simulation and Diagnosis of Mixed-Signal Systems Using Error Waveforms. DFT 1999: 357- - 1997
- [c1]Ramakrishna Voorakaranam, Sudip Chakrabarti, Junwei Hou, Alfred V. Gomes, Sasikumar Cherubal, Abhijit Chatterjee, William H. Kao:
Hierarchical Specification-Driven Analog Fault Modeling for Efficient Fault Simulation and Diagnosis. ITC 1997: 903-912
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