Effective Isolation of Fault-Correlated Variables via Statistical and Mutation Analysis.

Sat, 01 Apr 2023 01:00:00 +0200

Ming Wen , Zifan Xie , Kaixuan Luo , Xiao Chen, Yibiao Yang , Hai Jin :
Effective Isolation of Fault-Correlated Variables via Statistical and Mutation Analysis. IEEE Trans. Software Eng. 49(4): 2053-2068 (2023)