An accurate modeling method utilizing application-specific statistical information and its application to SRAM yield estimation.

Fri, 01 Jan 2010 00:00:00 +0100

Hidetoshi Matsuoka, Hiroshi Ikeda, Hiroyuki Higuchi, Yoshinori Tomita:
An accurate modeling method utilizing application-specific statistical information and its application to SRAM yield estimation. ISQED 2010: 22-28