
BibTeX records: J. L. Everaert
@article{DBLP:journals/mr/RothschildMKSEDCRVVVLBDJNAB07, author = {A. Rothschild and R. Mitsuhashi and Christoph Kerner and X. Shi and J. L. Everaert and L. Date and Thierry Conard and Olivier Richard and C. Vrancken and R. Verbeeck and Anabela Veloso and A. Lauwers and M. de Potter de ten Broeck and I. Debusschere and M. Jurczak and M. Niwa and Philippe Absil and S. Biesemans}, title = {Optimization of HfSiON using a design of experiment {(DOE)} approach on 0.45 {V} V\({}_{\mbox{t}}\) Ni-FUSI {CMOS} transistors}, journal = {Microelectron. Reliab.}, volume = {47}, number = {4-5}, pages = {521--524}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.01.042}, doi = {10.1016/j.microrel.2007.01.042}, timestamp = {Wed, 17 Feb 2021 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/RothschildMKSEDCRVVVLBDJNAB07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/tim/BisschopEVEM05, author = {Frank De Bisschop and Sunny Eloot and Pascal R. Verdonck and J. L. Everaert and Marc De Mets}, title = {Instrumental method for quantitative evaluation of cell or particle adhesion, based on transport measurements in capillary flow}, journal = {{IEEE} Trans. Instrum. Meas.}, volume = {54}, number = {5}, pages = {1891--1897}, year = {2005}, url = {https://doi.org/10.1109/TIM.2005.853563}, doi = {10.1109/TIM.2005.853563}, timestamp = {Mon, 08 Jun 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/tim/BisschopEVEM05.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }

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