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Israel Tirkel
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2010 – 2019
- 2019
- [j3]Ruth Sagron, Yoav Kerner, Gad Rabinowitz, Israel Tirkel:
New LST of inter-departure times in PH/G/1 queue, and extensions to ME/G/1 and G/G/1 queues. Comput. Ind. Eng. 135: 518-527 (2019) - 2017
- [j2]Ruth Sagron, Gad Rabinowitz
, Israel Tirkel:
Approximating class-departure variability in tandem queues with downtime events: Regression-based variability function. Comput. Oper. Res. 88: 161-174 (2017) - 2016
- [j1]Israel Tirkel
:
The efficiency of inspection based on out of control detection in wafer fabrication. Comput. Ind. Eng. 99: 458-464 (2016) - [c6]Adar A. Kalir, Israel Tirkel:
Scheduling preventive maintenance within a queue time for maximum throughput in semiconductor manufacturing. WSC 2016: 2750-2761 - 2015
- [c5]Maayan Eyal, Israel Tirkel
:
Throughput and flow-time in a production line with partial machine availability and imperfect quality processing. WSC 2015: 3144-3145 - 2013
- [c4]Dean Grosbard, Adar Kalir, Israel Tirkel
, Gad Rabinowitz
:
A queuing network model for wafer fabrication using decomposition without aggregation. CASE 2013: 717-722 - [c3]Israel Tirkel
:
The effectiveness of variability reduction in decreasing wafer fabrication cycle time. WSC 2013: 3796-3805 - 2012
- [c2]Israel Tirkel
:
Optimized inspection capacity for out of control detection in semiconductor manufacturing. WSC 2012: 190:1-190:8 - 2010
- [c1]Israel Tirkel, Gad Rabinowitz:
Quality Performance Modeling in a Deteriorating Production System with Partially Available Inspection. OR 2010: 397-402
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