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ORCIDNico Hellwege
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2010 – 2019
- 2017
[j2]Timur Schafer, Theodor Hillebrand, Nico Hellwege, Marco Erstling, Dagmar Peters-Drolshagen, Steffen Paul:
Design and Verification of Analog CMOS Circuits Using the g m/I D-Method with Age-Dependent Degradation Effects. J. Low Power Electron. 13(1): 135-147 (2017)- 2016
- [j1]Maike Taddiken, Nico Hellwege, Nils Heidmann, Dagmar Peters-Drolshagen, Steffen Paul:
Analysis of aging effects - From transistor to system level. Microelectron. Reliab. 67: 64-73 (2016) - [c12]Theodor Hillebrand, Nico Hellwege, Steffen Paul, Dagmar Peters-Drolshagen:
Reliability-aware design method for CMOS circuits. ERMAVSS@DATE 2016: 17-20 - [c11]Theodor Hillebrand, Nico Hellwege, Maike Taddiken, Konstantin Tscherkaschin, Steffen Paul
, Dagmar Peters-Drolshagen:
Stochastic LUT-based reliability-aware design method for operation point dependent CMOS circuits. MIXDES 2016: 363-368 - [c10]Theodor Hillebrand, Timur Schafer, Nico Hellwege, Marco Erstling, Dagmar Peters-Drolshagen, Steffen Paul:
Design and verification of analog CMOS circuits using the gm/ID-method with age-dependent degradation effects. PATMOS 2016: 136-141 - 2015
- [c9]Nils Heidmann, Nico Hellwege, Steffen Paul, Dagmar Peters-Drolshagen:
Variability-aware aging modeling for reliability analysis of an analog neural measurement system. ETS 2015: 1-6 - [c8]Nils Heidmann, Nico Hellwege, Steffen Paul, Dagmar Peters-Drolshagen:
NBTI and HCD aware behavioral models for reliability analysis of analog CMOS circuits. IRPS 2015: 1 - [c7]Nico Hellwege, Nils Heidmann, Marco Erstling, Dagmar Peters-Drolshagen, Steffen Paul:
An aging-aware transistor sizing tool regarding BTI and HCD degradation modes. MIXDES 2015: 272-277 - [c6]Nico Hellwege, Nils Heidmann, Steffen Paul, Dagmar Peters-Drolshagen:
Optimum Operating Points of Transistors with minimal Aging-Aware Sensitivity. SBCCI 2015: 14:1-14:7 - 2014
- [c5]Nils Heidmann, Nico Hellwege, Tim Hohlein, Thomas Westphal, Dagmar Peters-Drolshagen, Steffen Paul:
Modeling of an analog recording system design for ECoG and AP signals. DATE 2014: 1-6 - [c4]Nils Heidmann, Nico Hellwege, Maike Taddiken, Dagmar Peters-Drolshagen, Steffen Paul:
Analog behavioral modeling for age-dependent degradation of complex analog circuits. MIXDES 2014: 317-322 - [c3]Nasim Pour Aryan, Nils Heidmann, Martin Wirnshofer, Nico Hellwege, Jonas Pistor, Dagmar Peters-Drolshagen, Georg Georgakos, Steffen Paul, Doris Schmitt-Landsiedel:
Power efficient digital IC design for a medical application with high reliability requirements. PATMOS 2014: 1-5 - 2013
- [c2]Nico Hellwege, Nils Heidmann, Dagmar Peters-Drolshagen, Steffen Paul:
Reliability analysis for integrated circuit amplifiers used in neural measurement systems. DATE 2013: 713-716 - [c1]Nico Hellwege, Nils Heidmann, Dagmar Peters-Drolshagen, Steffen Paul:
Variability-aware gradual aging for generating reliability figures of a neural measurement system. MIXDES 2013: 380-385
Coauthor Index
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