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Olivia Bluder
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2010 – 2019
- 2018
- [c6]Dzenana Alagic, Olivia Bluder, Jürgen Pilz:
Quantification and Prediction of Damage in SAM Images of Semiconductor Devices. ICIAR 2018: 490-496 - [c5]Stefan Schrunner, Olivia Bluder, Anja Zernig, Andre Kästner, Roman Kern:
A Comparison of Supervised Approaches for Process Pattern Recognition in Analog Semiconductor Wafer Test Data. ICMLA 2018: 820-823 - 2017
- [c4]Stefan Schrunner, Olivia Bluder, Anja Zernig, Andre Kästner, Roman Kern:
Markov random fields for pattern extraction in analog wafer test data. IPTA 2017: 1-6 - [e1]Roman Kern, Gerald Reiner, Olivia Bluder:
Proceedings of the 1st International Workshop on Science, Application and Methods in Industry 4.0 co-located with (i-KNOW 2016), Graz, Austria, October 19, 2016. CEUR Workshop Proceedings 1793, CEUR-WS.org 2017 [contents] - 2014
- [c3]Olivia Bluder, Kathrin Plankensteiner, Michael Nelhiebel, Walther Heinz, Christian Leitner:
Modeling fatigue life of power semiconductor devices with ε-N fields. WSC 2014: 2609-2616 - [c2]Anja Zernig, Olivia Bluder, Jürgen Pilz, Andre Kästner:
Device level maverick screening: detection of risk devices through independent component analysis. WSC 2014: 2661-2670 - [c1]Kathrin Plankensteiner, Olivia Bluder, Jürgen Pilz:
Modeling and prediction of smart power semiconductor lifetime data using a gaussian process prior. WSC 2014: 2671-2681 - 2011
- [j1]Olivia Bluder, Michael Glavanovics, Jürgen Pilz:
Applying Bayesian mixtures-of-experts models to statistical description of smart power semiconductor reliability. Microelectron. Reliab. 51(9-11): 1464-1468 (2011)
Coauthor Index
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