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Wee-Lung Ang

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2013
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Wei-Cheng Lien, Kuen-Jong Lee, Tong-Yu Hsieh, Wee-Lung Ang:
An Efficient On-Chip Test Generation Scheme Based on Programmable and Multiple Twisted-Ring Counters. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 32(8): 1254-1264 (2013)

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