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ORCIDTianmei Li 0001
Person information
- affiliation: Xi'an Institute of High-Technology, Xi'an, China
Other persons with the same name
- Tianmei Li 0002 — Shenzhen University, School of Medicine, National-Regional Key Technology Engineering Laboratory for Medical Ultrasound, China
- Tianmei Li 0003 — Rocket Force University of Engineering, Xi'an, China
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2020 – today
- 2023
[j15]Tianmei Li, Hong Pei, Xiaosheng Si, Yaguo Lei
:
Prognosis for stochastic degrading systems with massive data: A data-model interactive perspective. Reliab. Eng. Syst. Saf. 237: 109344 (2023)- [j14]Hong Pei, Xiao-Sheng Si, Changhua Hu, Tianmei Li, Chuan He, Zhenan Pang:
Bayesian Deep-Learning-Based Prognostic Model for Equipment Without Label Data Related to Lifetime. IEEE Trans. Syst. Man Cybern. Syst. 53(1): 504-517 (2023) - 2022
- [j13]Xiao-Sheng Si, Tianmei Li, Jianxun Zhang, Yaguo Lei:
Nonlinear degradation modeling and prognostics: A Box-Cox transformation perspective. Reliab. Eng. Syst. Saf. 217: 108120 (2022) - 2021
- [j12]Xiaosheng Si, Changhua Hu, Tianmei Li, Qi Zhang:
A joint order-replacement policy for deteriorating components with reliability constraint. Sci. China Inf. Sci. 64(8) (2021) - [j11]Xiaosheng Si, Tianmei Li, Qi Zhang:
Optimal replacement of degrading components: a control-limit policy. Sci. China Inf. Sci. 64(10) (2021) - [j10]Hong Pei, Xiao-Sheng Si, Chang-Hua Hu, Jian-Fei Zheng, Tianmei Li, Jianxun Zhang, Zhenan Pang:
An adaptive prognostics method for fusing CDBN and diffusion process: Application to bearing data. Neurocomputing 421: 303-315 (2021) - [c2]Yuzhe Ma, Tianmei Li, Xiaosheng Si, Changhua Hu, Shengfei Zhang, Hao Zhang:
Sneak circuit analysis considering component performance degradation under digital twin model. CAA SAFEPROCESS 2021: 1-6 - [c1]Shengfei Zhang, Tianmei Li, Xiaosheng Si, Changhua Hu, Hao Zhang, Yuzhe Ma:
A New Missing Data Generation Method Based on An Improved DCGAN With Application to RUL Prediction. CAA SAFEPROCESS 2021: 1-6 - 2020
- [j9]Tianmei Li, Hong Pei, Zhenan Pang, Xiaosheng Si, Jian-Fei Zheng:
A Sequential Bayesian Updated Wiener Process Model for Remaining Useful Life Prediction. IEEE Access 8: 5471-5480 (2020) - [j8]Tianmei Li, Xiaosheng Si, Zonghao Yang, Hong Pei, Yuzhe Ma:
NHPP Testability Growth Model Considering Testability Growth Effort, Rectifying Delay, and Imperfect Correction. IEEE Access 8: 9072-9083 (2020) - [j7]Jian-Fei Zheng, Hanxiao Mu, Xuanjun Wang, Tian-Mei Li, Qi Zhang, Xi Wang:
An Adaptive Maintenance Policy With Nonlinear Degradation Modeling Based on Prognostic Information. IEEE Access 8: 160040-160049 (2020) - [j6]Xiaosheng Si, Tian-Mei Li, Qi Zhang, Changhua Hu:
Prognostics for Linear Stochastic Degrading Systems With Survival Measurements. IEEE Trans. Ind. Electron. 67(4): 3202-3215 (2020)
2010 – 2019
- 2019
- [j5]Xiaosheng Si, Tianmei Li, Qi Zhang:
A General Stochastic Degradation Modeling Approach for Prognostics of Degrading Systems With Surviving and Uncertain Measurements. IEEE Trans. Reliab. 68(3): 1080-1100 (2019) - 2018
- [j4]Xiaosheng Si, Tianmei Li, Qi Zhang, Xiaoxiang Hu:
An Optimal Condition-Based Replacement Method for Systems With Observed Degradation Signals. IEEE Trans. Reliab. 67(3): 1281-1293 (2018) - 2017
- [j3]Xiao-Sheng Si, Chang-Hua Hu, Qi Zhang, Tian-Mei Li:
An Integrated Reliability Estimation Approach With Stochastic Filtering and Degradation Modeling for Phased-Mission Systems. IEEE Trans. Cybern. 47(1): 67-80 (2017) - 2016
- [j2]Zhengxin Zhang, Xiao-Sheng Si, Chang-Hua Hu, Qi Zhang, Tian-Mei Li, Cong-Qi Xu:
Planning Repeated Degradation Testing for Products With Three-Source Variability. IEEE Trans. Reliab. 65(2): 640-647 (2016) - [j1]Chenxu Zhao, Krishna R. Pattipati, Guanjun Liu, Jing Qiu, Kehong Lv, Tianmei Li:
A Markov Chain-Based Testability Growth Model With a Cost-Benefit Function. IEEE Trans. Syst. Man Cybern. Syst. 46(4): 524-534 (2016)
Coauthor Index
aka: Xiao-Sheng Si
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