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S. Ueyama

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2013
[c1]
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Naoya Azuma, T. Makita, S. Ueyama, Makoto Nagata, Satoru Takahashi, Motoki Murakami, Kazuaki Hori, Satoshi Tanaka, Masahiro Yamaguchi:
In-system diagnosis of RF ICs for tolerance against on-chip in-band interferers. ITC 2013: 1-9

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