A PVT resilient short-time measurement solution for on-chip testing.

Mon, 01 Jan 2018 00:00:00 +0100

Esrafil Jedari, Rashid Rashidzadeh, Mehrdad Saif :
A PVT resilient short-time measurement solution for on-chip testing. Microelectron. J. 75: 35-40 (2018)