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Journal Articles
- 2020
[j9]Hyunyul Lim, Minho Cheong, Sungho Kang:
Scan-Chain-Fault Diagnosis Using Regressions in Cryptographic Chips for Wireless Sensor Networks. Sensors 20(17): 4771 (2020)- 2017
- [j8]Jaeseok Park, Hyunyul Lim, Sungho Kang
:
FRESH: A New Test Result Extraction Scheme for Fast TSV Tests. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 36(2): 336-345 (2017) - 2016
- [j7]Wooheon Kang, Changwook Lee, Hyunyul Lim, Sungho Kang:
A New 3-D Fuse Architecture to Improve Yield of 3-D Memories. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 35(10): 1763-1767 (2016) - [j6]Wooheon Kang, Changwook Lee, Hyunyul Lim, Sungho Kang:
Optimized Built-In Self-Repair for Multiple Memories. IEEE Trans. Very Large Scale Integr. Syst. 24(6): 2174-2183 (2016) - 2015
- [j5]Hyejeong Hong, Jaeil Lim, Hyunyul Lim, Sungho Kang:
Lifetime Reliability Enhancement of Microprocessors: Mitigating the Impact of Negative Bias Temperature Instability. ACM Comput. Surv. 48(1): 9:1-9:25 (2015) - [j4]Jaeil Lim, Hyunyul Lim, Sungho Kang:
3-D Stacked DRAM Refresh Management With Guaranteed Data Reliability. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 34(9): 1455-1466 (2015) - [j3]Wooheon Kang, Changwook Lee, Hyunyul Lim, Sungho Kang:
A 3 Dimensional Built-In Self-Repair Scheme for Yield Improvement of 3 Dimensional Memories. IEEE Trans. Reliab. 64(2): 586-595 (2015) - 2013
- [j2]Hyejeong Hong, Jaeil Lim, Hyunyul Lim, Sungho Kang:
Thermal-aware dynamic voltage frequency scaling for many-core processors under process variations. IEICE Electron. Express 10(14): 20130463 (2013) - [j1]Hyejeong Hong, Jaeil Lim, Hyunyul Lim, Sungho Kang:
Dynamic thermal management for 3D multicore processors under process variations. IEICE Electron. Express 10(23): 20130800 (2013)
Conference and Workshop Papers
- 2019
- [c5]Minho Cheng, Hyunyul Lim, Tae Hyun Kim, Sungho Kang:
A Hardware-efficient TSV Repair Scheme Based on Butterfly Topology. ISOCC 2019: 63-64 - 2018
- [c4]Dongsu Lee, Hyunyul Lim, Tae Hyun Kim, Sungho Kang:
Neural Network Reliability Enhancement Approach Using Dropout Underutilization in GPU. TENCON 2018: 2281-2286 - 2017
- [c3]Hyunyul Lim, Tae Hyun Kim, Dongsu Lee, Sungho Kang:
LARECD: Low area overhead and reliable error correction DMR architecture. ISOCC 2017: 27-28 - 2016
- [c2]Tae Hyun Kim, Hyunyul Lim, Sungho Kang:
P-backtracking: A new scan chain diagnosis method with probability. ISOCC 2016: 141-142 - 2015
- [c1]Hyunyul Lim, Wooheon Kang, Sungyoul Seo, Yong Lee, Sungho Kang:
Low power scan bypass technique with test data reduction. ISQED 2015: 173-176
Coauthor Index
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