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2020 – today
- 2023
[c12]Yoona Kim, Inhyuk Choi, Juhyung Park, Jaeheon Lee, Sungjin Lee, Jihong Kim:
Integrated Host-SSD Mapping Table Management for Improving User Experience of Smartphones. FAST 2023: 441-456- [c11]Dusol Lee
, Inhyuk Choi, Chanyoung Lee, Sungjin Lee, Jihong Kim:
P2Cache: An Application-Directed Page Cache for Improving Performance of Data-Intensive Applications. HotStorage 2023: 31-36 - 2022
- [c10]Sanggu Lee, Yoona Kim, Dusol Lee, Inhyuk Choi, Jihong Kim:
Alohomora: protecting files from ransomware attacks using fine-grained I/O whitelisting. HotStorage 2022: 113-118 - 2020
- [j7]Taeyong Kim, Simpy Sanyal, Ja-Bin Koo, Ju-Am Son, Inhyuk Choi, Junsin Yi:
Analysis of Thermal Sensitivity by High Voltage Insulator Materials. IEEE Access 8: 75586-75591 (2020)
2010 – 2019
- 2018
- [j6]Inhyuk Choi, Hyunggoy Oh, Young-Woo Lee, Sungho Kang:
Test Resource Reused Debug Scheme to Reduce the Post-Silicon Debug Cost. IEEE Trans. Computers 67(12): 1835-1839 (2018) - 2017
- [j5]Hyunggoy Oh, Taewoo Han, Inhyuk Choi, Sungho Kang:
An On-Chip Error Detection Method to Reduce the Post-Silicon Debug Time. IEEE Trans. Computers 66(1): 38-44 (2017) - [j4]Hyunggoy Oh, Inhyuk Choi, Sungho Kang:
DRAM-Based Error Detection Method to Reduce the Post-Silicon Debug Time for Multiple Identical Cores. IEEE Trans. Computers 66(9): 1504-1517 (2017) - [c9]Young-Woo Lee, Inhyuk Choi, Kang-Hoon Oh, James Jinsoo Ko, Sungho Kang:
Test item priority estimation for high parallel test efficiency under ATE debug time constraints. ITC-Asia 2017: 150-154 - 2016
- [j3]Taewoo Han, Inhyuk Choi, Hyunggoy Oh, Sungho Kang:
Parallelized Network-on-Chip-Reused Test Access Mechanism for Multiple Identical Cores. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 35(7): 1219-1223 (2016) - [c8]Hyunggoy Oh, Inhyuk Choi, Sungho Kang:
A new online test and debug methodology for automotive camera image processing system. APCCAS 2016: 370-371 - [c7]Inhyuk Choi, Hyunggoy Oh, Sungho Kang:
Test access mechaism for stack test time reduction of 3-dimensional integrated circuit. APCCAS 2016: 522-525 - [c6]Soyeon Kang, Inhyuk Choi, Hyeonchan Lim, Sungyoul Seo, Sungho Kang:
Software-based embedded core test using multi-polynomial for test data reduction. ISOCC 2016: 39-40 - [c5]Young-Woo Lee, Junghwan Kim, Inhyuk Choi, Sungho Kang:
A TSV test structure for simultaneously detecting resistive open and bridge defects in 3D-ICs. ISOCC 2016: 129-130 - [c4]Heetae Kim, Inhyuk Choi, Jaeil Lim, Hyunggoy Oh, Sungho Kang:
Process variation-aware bridge fault analysis. ISOCC 2016: 147-148 - 2015
- [j2]Taewoo Han, Inhyuk Choi, Sungho Kang:
Majority-Based Test Access Mechanism for Parallel Testing of Multiple Identical Cores. IEEE Trans. Very Large Scale Integr. Syst. 23(8): 1439-1447 (2015) - 2014
- [j1]Taewoo Han, Inhyuk Choi, Sungho Kang:
A novel test access mechanism for parallel testing of multi-core system. IEICE Electron. Express 11(6): 20140093 (2014) - [c3]Taewoo Han, Inhyuk Choi, Hyunggoy Oh, Sungho Kang:
A Scalable and Parallel Test Access Strategy for NoC-Based Multicore System. ATS 2014: 81-86 - 2013
- [c2]Inhyuk Choi, Taewoo Han, Sungho Kang:
Bit transmission error correction scheme for FlexRay based automotive communication systems. GCCE 2013: 488-490 - 2011
- [c1]Inhyuk Choi, Taewoo Han, Ilwoong Kim, Sungho Kang:
Path search engine for fast optimal path search using efficient hardware architecture. ISOCC 2011: 96-99
Coauthor Index
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