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P. J. J. H. A. Habets

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2004
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Marcel A. J. van Gils, P. J. J. H. A. Habets, G. Q. Zhang, Willem D. van Driel, Piet J. G. Schreurs:
Characterization and Modelling of Moisture Driven Interface Failures. Microelectron. Reliab. 44(9-11): 1317-1322 (2004)

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