![](https://dblp.org/img/logo.ua.320x120.png)
![](https://dblp.org/img/dropdown.dark.16x16.png)
![](https://dblp.org/img/peace.dark.16x16.png)
Остановите войну!
for scientists:
![search dblp search dblp](https://dblp.org/img/search.dark.16x16.png)
![search dblp](https://dblp.org/img/search.dark.16x16.png)
default search action
G. Cardoso Medeiros
Person information
Refine list
![note](https://dblp.org/img/note-mark.dark.12x12.png)
refinements active!
zoomed in on ?? of ?? records
view refined list in
export refined list as
2020 – today
- 2022
- [j9]Moritz Fieback
, Guilherme Cardoso Medeiros, Lizhou Wu
, Hassen Aziza, Rajendra Bishnoi, Mottaqiallah Taouil, Said Hamdioui
:
Defects, Fault Modeling, and Test Development Framework for RRAMs. ACM J. Emerg. Technol. Comput. Syst. 18(3): 52:1-52:26 (2022) - [c18]Moritz Fieback
, Christopher Münch, Anteneh Gebregiorgis, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Said Hamdioui, Mehdi B. Tahoori:
PVT Analysis for RRAM and STT-MRAM-based Logic Computation-in-Memory. ETS 2022: 1-6 - [c17]Guilherme Cardoso Medeiros, Moritz Fieback
, Anteneh Gebregiorgis, Mottaqiallah Taouil, Letícia Maria Veiras Bolzani, Said Hamdioui:
Hierarchical Memory Diagnosis. ETS 2022: 1-2 - 2021
- [j8]Thiago Copetti
, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Said Hamdioui, Letícia Maria Bolzani Poehls, Tiago Roberto Balen:
Evaluation of Single Event Upset Susceptibility of FinFET-based SRAMs with Weak Resistive Defects. J. Electron. Test. 37(3): 383-394 (2021) - [j7]Lizhou Wu
, Siddharth Rao
, Mottaqiallah Taouil
, Guilherme Cardoso Medeiros, Moritz Fieback
, Erik Jan Marinissen
, Gouri Sankar Kar, Said Hamdioui
:
Defect and Fault Modeling Framework for STT-MRAM Testing. IEEE Trans. Emerg. Top. Comput. 9(2): 707-723 (2021) - [j6]Guilherme Cardoso Medeiros
, Moritz Fieback
, Lizhou Wu
, Mottaqiallah Taouil
, Letícia Maria Bolzani Poehls
, Said Hamdioui
:
Hard-to-Detect Fault Analysis in FinFET SRAMs. IEEE Trans. Very Large Scale Integr. Syst. 29(6): 1271-1284 (2021) - [c16]Aneesh Balakrishnan
, Guilherme Cardoso Medeiros, Cemil Cem Gürsoy, Said Hamdioui, Maksim Jenihhin, Dan Alexandrescu:
Modeling Soft-Error Reliability Under Variability. DFT 2021: 1-6 - [c15]G. Cardoso Medeiros, Moritz Fieback
, Thiago Santos Copetti, Anteneh Gebregiorgis, Mottaqiallah Taouil, Leticia B. Poehls, Said Hamdioui:
Improving the Detection of Undefined State Faults in FinFET SRAMs. DTIS 2021: 1-6 - [c14]Moritz Fieback
, Guilherme Cardoso Medeiros, Anteneh Gebregiorgis, Hassen Aziza, Mottaqiallah Taouil, Said Hamdioui:
Intermittent Undefined State Fault in RRAMs. ETS 2021: 1-6 - [c13]G. Cardoso Medeiros, Moritz Fieback
, Anteneh Gebregiorgis, Mottaqiallah Taouil, Leticia Bolzani Poehls, Said Hamdioui:
Detecting Random Read Faults to Reduce Test Escapes in FinFET SRAMs. ETS 2021: 1-6 - 2020
- [c12]Guilherme Cardoso Medeiros, Cemil Cem Gürsoy, Lizhou Wu, Moritz Fieback
, Maksim Jenihhin, Mottaqiallah Taouil, Said Hamdioui:
A DFT Scheme to Improve Coverage of Hard-to-Detect Faults in FinFET SRAMs. DATE 2020: 792-797 - [c11]Thiago Copetti, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Said Hamdioui, Leticia Bolzani Poehls, Tiago R. Balen:
Evaluating the Impact of Ionizing Particles on FinFET -based SRAMs with Weak Resistive Defects. LATS 2020: 1-6
2010 – 2019
- 2019
- [j5]G. Cardoso Medeiros, E. Brum, Leticia Bolzani Poehls, Thiago Copetti, Tiago R. Balen:
Evaluating the Impact of Temperature on Dynamic Fault Behaviour of FinFET-Based SRAMs with Resistive Defects. J. Electron. Test. 35(2): 191-200 (2019) - [c10]Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Moritz Fieback
, Leticia Bolzani Poehls, Said Hamdioui:
DFT Scheme for Hard-to-Detect Faults in FinFET SRAMs. ETS 2019: 1-2 - [c9]Lizhou Wu, Siddharth Rao
, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Erik Jan Marinissen
, Farrukh Yasin, Sebastien Couet
, Said Hamdioui, Gouri Sankar Kar:
Pinhole Defect Characterization and Fault Modeling for STT-MRAM Testing. ETS 2019: 1-6 - [c8]Moritz Fieback
, Lizhou Wu, Guilherme Cardoso Medeiros, Hassen Aziza, Siddharth Rao
, Erik Jan Marinissen, Mottaqiallah Taouil, Said Hamdioui:
Device-Aware Test: A New Test Approach Towards DPPB Level. ITC 2019: 1-10 - 2018
- [j4]G. Cardoso Medeiros, Letícia Maria Veiras Bolzani, Mottaqiallah Taouil, Fabian Vargas, Said Hamdioui:
A defect-oriented test approach using on-Chip current sensors for resistive defects in FinFET SRAMs. Microelectron. Reliab. 88-90: 355-359 (2018) - [c7]G. Cardoso Medeiros, E. Brum, Leticia Bolzani Poehls, Thiago Copetti, Tiago R. Balen:
Influence of temperature on dynamic fault behavior due to resistive defects in FinFET-based SRAMs. LATS 2018: 1-6 - [c6]George Redivo Pinto, Guilherme Cardoso Medeiros, Fabian Vargas, Leticia Bolzani Poehls:
A hardware-based approach for SEU monitoring in SRAMs with weak resistive defects. LATS 2018: 1-6 - 2017
- [j3]M. Tulio Martins, G. Cardoso Medeiros, Thiago Copetti, Fabian Vargas, Marcus Pohls:
Analysing NBTI Impact on SRAMs with Resistive Defects. J. Electron. Test. 33(5): 637-655 (2017) - [c5]Thiago Santos Copetti, Tiago R. Balen, Guilherme Cardoso Medeiros, Letícia Maria Bolzani Poehls:
Analyzing the behavior of FinFET SRAMs with resistive defects. VLSI-SoC 2017: 1-6 - [c4]Thiago Santos Copetti, Guilherme Cardoso Medeiros, Letícia Maria Bolzani Poehls, Tiago R. Balen:
Evaluating the Impact of Resistive Defects on FinFET-Based SRAMs. VLSI-SoC (Selected Papers) 2017: 22-45 - 2016
- [j2]Maksim Jenihhin
, Giovanni Squillero
, Thiago Santos Copetti, Valentin Tihhomirov, Sergei Kostin, Marco Gaudesi, Fabian Vargas, Jaan Raik
, Matteo Sonza Reorda
, Leticia Bolzani Poehls, Raimund Ubar
, Guilherme Cardoso Medeiros:
Identification and Rejuvenation of NBTI-Critical Logic Paths in Nanoscale Circuits. J. Electron. Test. 32(3): 273-289 (2016) - [j1]Thiago Copetti, Guilherme Cardoso Medeiros, Leticia Bolzani Poehls, Fabian Vargas:
NBTI-Aware Design of Integrated Circuits: A Hardware-Based Approach for Increasing Circuits' Life Time. J. Electron. Test. 32(3): 315-328 (2016) - [c3]M. Tulio Martins, G. Cardoso Medeiros, Thiago Copetti, Fabian Vargas, Letícia Maria Bolzani Poehls:
Analyzing NBTI impact on SRAMs with resistive-open defects. LATS 2016: 87-92 - [c2]G. Cardoso Medeiros, Letícia Maria Bolzani Pöhls, Fabian Vargas:
Analyzing the Impact of SEUs on SRAMs with Resistive-Bridge Defects. VLSID 2016: 487-492 - 2015
- [c1]Thiago Copetti, G. Cardoso Medeiros, Letícia Maria Bolzani Poehls, Fabian Vargas:
NBTI-aware design of integrated circuits: a hardware-based approach. LATS 2015: 1-6
Coauthor Index
aka: Letícia Maria Bolzani Poehls
aka: Letícia Maria Bolzani Pöhls
aka: Leticia B. Poehls
aka: Leticia Bolzani Poehls
aka: Thiago Santos Copetti
![](https://dblp.org/img/cog.dark.24x24.png)
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.
Unpaywalled article links
Add open access links from to the list of external document links (if available).
Privacy notice: By enabling the option above, your browser will contact the API of unpaywall.org to load hyperlinks to open access articles. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Unpaywall privacy policy.
Archived links via Wayback Machine
For web page which are no longer available, try to retrieve content from the of the Internet Archive (if available).
Privacy notice: By enabling the option above, your browser will contact the API of archive.org to check for archived content of web pages that are no longer available. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Internet Archive privacy policy.
Reference lists
Add a list of references from ,
, and
to record detail pages.
load references from crossref.org and opencitations.net
Privacy notice: By enabling the option above, your browser will contact the APIs of crossref.org, opencitations.net, and semanticscholar.org to load article reference information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Crossref privacy policy and the OpenCitations privacy policy, as well as the AI2 Privacy Policy covering Semantic Scholar.
Citation data
Add a list of citing articles from and
to record detail pages.
load citations from opencitations.net
Privacy notice: By enabling the option above, your browser will contact the API of opencitations.net and semanticscholar.org to load citation information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the OpenCitations privacy policy as well as the AI2 Privacy Policy covering Semantic Scholar.
OpenAlex data
Load additional information about publications from .
Privacy notice: By enabling the option above, your browser will contact the API of openalex.org to load additional information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the information given by OpenAlex.
last updated on 2024-05-08 20:56 CEST by the dblp team
all metadata released as open data under CC0 1.0 license
see also: Terms of Use | Privacy Policy | Imprint