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Mattias Van Dael

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2010 – 2019

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2017
[j1]
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  dblp key:
  - journals/cea/PereiraJCTDVNS17
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  persistent URL:
  - https://dblp.org/rec/journals/cea/PereiraJCTDVNS17
Luis Filipe Alves Pereira, Eline Janssens, George D. C. Cavalcanti, Ing Ren Tsang, Mattias Van Dael, Pieter Verboven, Bart M. Nicolaï, Jan Sijbers:
Inline discrete tomography system: Application to agricultural product inspection. Comput. Electron. Agric. 138: 117-126 (2017)
2015
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  - conf/icip/JanssensBDVNS15
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  - https://dblp.org/rec/conf/icip/JanssensBDVNS15
Eline Janssens, Jan De Beenhouwer, Mattias Van Dael, Pieter Verboven, Bart M. Nicolaï, Jan Sijbers:
Neural netwok based X-ray tomography for fast inspection of apples on a conveyor belt system. ICIP 2015: 917-921

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