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Chin Hu Ong

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2000 – 2009

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2008
[c2]
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  - conf/ats/KhusyariNJANAO08
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Khairul Khusyari, Wei Tee Ng, Neal Jaarsma, Robert Abraham, Peng Weng Ng, Boon Hui Ang, Chin Hu Ong:
Diagnosis of Voltage Dependent Scan Chain Failure Using VBUMP Scan Debug Method. ATS 2008: 271
2007
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Yu Wei P'ng, Moo Kit Lee, Peng Weng Ng, Chin Hu Ong:
IDDQ Test Challenges in Nanotechnologies: A Manufacturing Test Strategy. ATS 2007: 211

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