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Kong Boon Yeap
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2010 – 2019
- 2018
- [j1]Sean P. Ogden, Yueming Xu, Kong Boon Yeap, Tian Shen, Toh-Ming Lu, Joel L. Plawsky:
Charge transport model to predict dielectric breakdown as a function of voltage, temperature, and thickness. Microelectron. Reliab. 91: 232-242 (2018) - [c5]Tian Shen, Kong Boon Yeap, Sean P. Ogden, Cathryn Christiansen, Patrick Justison:
New insight on TDDB area scaling methodology of non-Poisson systems. IRPS 2018: 1 - [c4]Seungman Choi, Cathryn Christiansen, Linjun Cao, James Zhang, Ronald Filippi, Tian Shen, Kong Boon Yeap, Sean P. Ogden, Haojun Zhang, Bianzhu Fu, Patrick Justison:
Effect of metal line width on electromigration of BEOL Cu interconnects. IRPS 2018: 4 - 2015
- [c3]Wenyi Zhang, M. C. Silvestre, A. Selvam, E. Ramanathan, C. Ordonio, J. Schaller, Tian Shen, Kong Boon Yeap, C. Capasso, Patrick Justison, J. H. Lee:
An investigation of process dependence of porous IMD TDDB. IRPS 2015: 1 - [c2]Kong Boon Yeap, Tian Shen, Galor Wenyi Zhang, Sing Fui Yap, Brian Holt, Arfa Gondal, Seungman Choi, San Leong Liew, Walter Yao, Patrick Justison:
Impact of electrode surface modulation on time-dependent dielectric breakdown. IRPS 2015: 2 - [c1]Tian Shen, Wenyi Zhang, Kong Boon Yeap, Jing Tan, Walter Yao, Patrick Justison:
An investigation of dielectric thickness scaling on BEOL TDDB. IRPS 2015: 3
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