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Chuanhe Jay Shan
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2020 – today
- 2021
- [c10]Yueling Jenny Zeng, Li-C. Wang, Chuanhe Jay Shan:
MINiature Interactive Offset Networks (MINIONs) for Wafer Map Classification. ITC 2021: 190-199 - 2020
- [c9]Yueling Jenny Zeng, Li-C. Wang, Chuanhe Jay Shan, Nik Sumikawa:
Learning A Wafer Feature With One Training Sample. ITC 2020: 1-10
2010 – 2019
- 2019
- [c8]Li-C. Wang, Chuanhe Jay Shan, Ahmed Wahba:
Facilitating Deployment Of A Wafer-Based Analytic Software Using Tensor Methods: Invited Paper. ICCAD 2019: 1-8 - [c7]Chuanhe Jay Shan, Ahmed Wahba, Li-C. Wang, Nik Sumikawa:
Deploying A Machine Learning Solution As A Surrogate. ITC 2019: 1-10 - [c6]Ahmed Wahba, Chuanhe Jay Shan, Li-C. Wang, Nik Sumikawa:
Wafer Plot Classification Using Neural Networks and Tensor Methods. ITC-Asia 2019: 79-84 - [c5]Ahmed Wahba, Chuanhe Jay Shan, Li-C. Wang, Nik Sumikawa:
Primitive Concept Identification In A Given Set Of Wafer Maps. VLSI-DAT 2019: 1-4 - 2018
- [c4]Matthew Nero, Chuanhe Jay Shan, Li-C. Wang, Nik Sumikawa:
Concept Recognition in Production Yield Data Analytics. ITC 2018: 1-10 - [i1]Matthew Nero, Chuanhe Jay Shan, Li-C. Wang, Nik Sumikawa:
Discovering Interesting Plots in Production Yield Data Analytics. CoRR abs/1807.03920 (2018) - 2017
- [c3]Chuanhe Jay Shan, Pietro Babighian, Yan Pan, John M. Carulli, Li-C. Wang:
Systematic defect detection methodology for volume diagnosis: A data mining perspective. ITC 2017: 1-10 - [c2]Li-C. Wang, Sebastian Siatkowski, Chuanhe Jay Shan, Matthew Nero, Nikolas Sumikawa, LeRoy Winemberg:
Some considerations on choosing an outlier method for automotive product lines. ITC 2017: 1-10 - 2016
- [c1]Sebastian Siatkowski, Chuanhe Jay Shan, Li-C. Wang
, Nikolas Sumikawa, W. Robert Daasch, John M. Carulli:
Consistency in wafer based outlier screening. VTS 2016: 1-6
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