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Tzuo-Li Wang

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2016
[j1]
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Wenqi Zhang, Tzuo-Li Wang, Yan-hua Huang, Tsu-Ting Cheng, Shih-Yao Chen, Yiying Li, Chun-Hsiang Hsu, Chih-Jui Lai, Wen-Kuan Yeh, Yilin Yang:
Influence of fin number on hot-carrier injection stress induced degradation in bulk FinFETs. Microelectron. Reliab. 67: 89-93 (2016)

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