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Wei-Chung Kao

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2010 – 2019

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2010
[j1]
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  - journals/tvlsi/KaoCLLM10
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  - https://dblp.org/rec/journals/tvlsi/KaoCLLM10
Wei-Chung Kao, Wei-Shun Chuang, Shiu-Ting Lin, Chien-Mo James Li, Vasco Manquinho:
DFT and Minimum Leakage Pattern Generation for Static Power Reduction During Test and Burn-In. IEEE Trans. Very Large Scale Integr. Syst. 18(3): 392-400 (2010)

2000 – 2009

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2007
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  - conf/ats/ChenKBSL07
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Bo-Hua Chen, Wei-Chung Kao, Bing-Chuan Bai, Shyue-Tsong Shen, James C.-M. Li:
Response Inversion Scan Cell (RISC): A Peak Capture Power Reduction Technique. ATS 2007: 425-432

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