NAND Flash Memory Forensic Analysis and the Growing Challenge of Bit Errors.

Sun, 01 Jan 2017 00:00:00 +0100

Jan Peter van Zandwijk, Aya Fukami :
NAND Flash Memory Forensic Analysis and the Growing Challenge of Bit Errors. IEEE Secur. Priv. 15(6): 82-87 (2017)