Improving the reliability of chip-off forensic analysis of NAND flash memory devices.

Sun, 01 Jan 2017 00:00:00 +0100

Aya Fukami , Saugata Ghose, Yixin Luo, Yu Cai, Onur Mutlu :
Improving the reliability of chip-off forensic analysis of NAND flash memory devices. Digit. Investig. 20 Supplement: S1-S11 (2017)