Simulation-to-Reality based Transfer Learning for the Failure Analysis of SiC Power Transistors.

Sat, 01 Jan 2022 00:00:00 +0100

Simon Kamm, Sandra Bickelhaupt, Kanuj Sharma, Nasser Jazdi, Ingmar Kallfass, Michael Weyrich:
Simulation-to-Reality based Transfer Learning for the Failure Analysis of SiC Power Transistors. ETFA 2022: 1-8