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Robert W. Atherton

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1990 – 1999

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1990
[c7]
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Robert W. Atherton, Linda F. Atherton, Mark Pool:
Detailed simulation for semiconductor manufacturing. WSC 1990: 659-663

1980 – 1989

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1987
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Judith E. Dayhoff, Robert W. Atherton:
A Model for Wafer Fabrication Dynamics in Integrated Circuit Manufacturing. IEEE Trans. Syst. Man Cybern. 17(1): 91-100 (1987)
1986
[c6]
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Judith E. Dayhoff, Robert W. Atherton:
Financial Impact of Tester Reliability Improvements. ITC 1986: 195-204
1985
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Judith E. Dayhoff, Robert W. Atherton:
Financial Implications of a Detailed Analysis of Test Floor Operations. ITC 1985: 23-32
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Robert W. Atherton, John L. Mudge:
Microprocessor Speed Optimization Using Pattern-Recognition Analysis of Parametric Test Data. ITC 1985: 938-948
1984
[c3]
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Robert W. Atherton, Leonard Ekkelkamp, Chuck Schmitz:
Logic Device Characterization Using Computer-Aided Test and Analysis. ITC 1984: 367-383
1983
[c2]
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Robert W. Atherton, David M. Campbell:
Use of In-Fab Parametric Testing for Process Control of Semiconductor Manufacturing. ITC 1983: 238-247
[c1]
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Robert W. Atherton, Alfred H. Miller Jr., Judith E. Dayhoff:
Operations Management and Analysis in the Management of Electronic Testing. ITC 1983: 418-427

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