Processing and Analysis of Long-Range Scans with an Atomic Force Microscope (AFM) in Combination with Nanopositioning and Nanomeasuring Technology for Defect Detection and Quality Control.

Fri, 01 Jan 2021 00:00:00 +0100

Ingo Ortlepp , Jaqueline Stauffenberg , Eberhard Manske :
Processing and Analysis of Long-Range Scans with an Atomic Force Microscope (AFM) in Combination with Nanopositioning and Nanomeasuring Technology for Defect Detection and Quality Control. Sensors 21(17): 5862 (2021)