BibTeX records: G. T. Jeong

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@inproceedings{DBLP:conf/irps/JiGLLLUPHSLSLSH19,
  author    = {Y. Ji and
               H. J. Goo and
               J. Lim and
               S. B. Lee and
               S. Lee and
               Taiki Uemura and
               J. C. Park and
               S. I. Han and
               S. C. Shin and
               J. H. Lee and
               Y. J. Song and
               K. M. Lee and
               H. M. Shin and
               S. H. Hwang and
               B. Y. Seo and
               Y. K. Lee and
               J. C. Kim and
               G. H. Koh and
               K. C. Park and
               Sangwoo Pae and
               G. T. Jeong and
               J. S. Yoon and
               E. S. Jung},
  title     = {Reliability of 8Mbit Embedded-STT-MRAM in 28nm {FDSOI} Technology},
  booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2019, Monterey,
               CA, USA, March 31 - April 4, 2019},
  pages     = {1--3},
  publisher = {{IEEE}},
  year      = {2019},
  url       = {https://doi.org/10.1109/IRPS.2019.8720429},
  doi       = {10.1109/IRPS.2019.8720429},
  timestamp = {Thu, 30 Jul 2020 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/conf/irps/JiGLLLUPHSLSLSH19.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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