BibTeX records: S. I. Han

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@inproceedings{DBLP:conf/irps/JiGLJUKSLPJHLLH20,
  author    = {Y. Ji and
               H. J. Goo and
               J. Lim and
               T. Y. Jeong and
               T. Uemura and
               G. R. Kim and
               B. I. Seo and
               S. Lee and
               G. Park and
               J. Jo and
               S. I. Han and
               K. Lee and
               J. Lee and
               S. H. Hwang and
               D. S. Lee and
               S. Pyo and
               H. T. Jung and
               S. H. Han and
               S. Noh and
               K. Suh and
               S. Y. Yoon and
               H. Nam and
               H. Hwang and
               H. Jiang and
               J. W. Kim and
               D. Kwon and
               Y. J. Song and
               K. H. Koh and
               H. S. Rhee and
               Sangwoo Pae and
               E. Lee},
  title     = {Reliability of Industrial grade Embedded-STT-MRAM},
  booktitle = {2020 {IEEE} International Reliability Physics Symposium, {IRPS} 2020,
               Dallas, TX, USA, April 28 - May 30, 2020},
  pages     = {1--3},
  publisher = {{IEEE}},
  year      = {2020},
  url       = {https://doi.org/10.1109/IRPS45951.2020.9129178},
  doi       = {10.1109/IRPS45951.2020.9129178},
  timestamp = {Thu, 30 Jul 2020 15:13:12 +0200},
  biburl    = {https://dblp.org/rec/conf/irps/JiGLJUKSLPJHLLH20.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/JiGLLLUPHSLSLSH19,
  author    = {Y. Ji and
               H. J. Goo and
               J. Lim and
               S. B. Lee and
               S. Lee and
               Taiki Uemura and
               J. C. Park and
               S. I. Han and
               S. C. Shin and
               J. H. Lee and
               Y. J. Song and
               K. M. Lee and
               H. M. Shin and
               S. H. Hwang and
               B. Y. Seo and
               Y. K. Lee and
               J. C. Kim and
               G. H. Koh and
               K. C. Park and
               Sangwoo Pae and
               G. T. Jeong and
               J. S. Yoon and
               E. S. Jung},
  title     = {Reliability of 8Mbit Embedded-STT-MRAM in 28nm {FDSOI} Technology},
  booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2019, Monterey,
               CA, USA, March 31 - April 4, 2019},
  pages     = {1--3},
  publisher = {{IEEE}},
  year      = {2019},
  url       = {https://doi.org/10.1109/IRPS.2019.8720429},
  doi       = {10.1109/IRPS.2019.8720429},
  timestamp = {Thu, 30 Jul 2020 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/conf/irps/JiGLLLUPHSLSLSH19.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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