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Peter Baumgartner 0005

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affiliation: Intel, Neubiberg, Germany
affiliation: Infineon Technologies AG, Neubiberg, Germany

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Journal Articles

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2023
[j4]
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  - journals/tcasII/SchrammBA23
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  - https://dblp.org/rec/journals/tcasII/SchrammBA23
Lukas Schramm, Peter Baumgartner, Jasmin Aghassi-Hagmann:
On-Chip Quantization- and Correlation-Robust Jitter Measurement for Low Phase Noise and High Frequency Oscillators. IEEE Trans. Circuits Syst. II Express Briefs 70(11): 3958-3962 (2023)
2022
[j3]
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Richard Hudeczek, Ehrentraud Hager, Peter Baumgartner, Harald Pretl:
Performance Analysis of Resonant-Fin Transistors and Their Application in RF-Circuit Design. IEEE Access 10: 64388-64407 (2022)
2009
[j2]
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Domagoj Siprak, Marc Tiebout, Nicola Zanolla, Peter Baumgartner, Claudio Fiegna:
Noise Reduction in CMOS Circuits Through Switched Gate and Forward Substrate Bias. IEEE J. Solid State Circuits 44(7): 1959-1967 (2009)
2001
[j1]
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Bakuri Lanchava, Peter Baumgartner, Andreas Martin, Armand Beyer, Erich Mueller:
Oxide reliability: influence of interface roughness, structure layout, and depletion layer formation. Microelectron. Reliab. 41(7): 1097-1100 (2001)

Conference and Workshop Papers

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2023
[c3]
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  - conf/prime/SchrammBA23
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Lukas Schramm, Peter Baumgartner, Jasmin Aghassi-Hagmann:
Influence of Transistor Compact Model Accuracy on Phase Noise Simulation. PRIME 2023: 329-332
2021
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Richard Hudeczek, Peter Baumgartner:
Mechanical Band Gap Formation in Anisotropic CMOS Back-End-of-Line Stacks for Monolithic High-Q MEMS Resonator Confinement. ESSDERC 2021: 211-214
2008
[c1]
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  - conf/esscirc/SiprakT008
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Domagoj Siprak, Marc Tiebout, Peter Baumgartner:
Reduction of VCO phase noise through forward substrate biasing of switched MOSFETs. ESSCIRC 2008: 326-329

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