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Dennis P. Nyquist

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Journal Articles

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2006
[j2]
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  - journals/tim/HavrillaN06
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  - https://dblp.org/rec/journals/tim/HavrillaN06
Michael J. Havrilla, Dennis P. Nyquist:
Electromagnetic characterization of layered materials via direct and de-embed methods. IEEE Trans. Instrum. Meas. 55(1): 158-163 (2006)
1991
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Carl E. Baum, Edward J. Rothwell, Kun-Mu Chen, Dennis P. Nyquist:
The singularity expansion method and its application to target identification. Proc. IEEE 79(10): 1481-1492 (1991)

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