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Alexander Grill
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2020 – today
- 2024
- [c15]Kateryna Serbulova, Zi-En Qiu, Shih-Hung Chen, Alexander Grill, Kuo-Hsing Kao, Jo De Boeck, Guido Groeseneken
:
Insight into Latchup Risk in 28nm Planar Bulk Technology for Quantum Computing Applications. IRPS 2024: 1-7 - 2023
- [c14]Francesco Lorenzelli, Asser Elsayed, Clement Godfrin, Alexander Grill, Stefan Kubicek, Ruoyu Li, Michele Stucchi, Danny Wan, Kristiaan De Greve, Erik Jan Marinissen, Georges G. E. Gielen:
Study of Transistor Metrics for Room-Temperature Screening of Single Electron Transistors for Silicon Spin Qubit Applications. ETS 2023: 1-6 - [c13]Francesco Lorenzelli, Asser Elsayed, Clement Godfrin, Alexander Grill, Stefan Kubicek, Ruoyu Li, Michele Stucchi, Danny Wan, Kristiaan De Greve, Erik Jan Marinissen, Georges G. E. Gielen:
Wafer-Scale Electrical Characterization of Silicon Quantum Dots from Room to Low Temperatures. ITC 2023: 151-158 - 2022
- [c12]Barry J. O'Sullivan, Brecht Truijen, Vamsi Putcha, Alexander Grill, Adrian Vaisman Chasin, Geert Van den Bosch, Ben Kaczer, Md Nur K. Alam, Jan Van Houdt:
Modelling ultra-fast threshold voltage instabilities in Hf-based ferroelectrics. IRPS 2022: 4 - [c11]Stanislav Tyaginov, Alexander Makarov, Al-Moatasem Bellah El-Sayed, Adrian Vaisman Chasin, Erik Bury, Markus Jech, Michiel Vandemaele, Alexander Grill, An De Keersgieter, Mikhail I. Vexler, Geert Eneman, Ben Kaczer:
Understanding and Modeling Opposite Impacts of Self-Heating on Hot-Carrier Degradation in n- and p-Channel Transistors. IRPS 2022: 6 - [c10]Alexander Grill, V. John, Jakob Michl, A. Beckers, Erik Bury, Stanislav Tyaginov, Bertrand Parvais, Adrian Vaisman Chasin, Tibor Grasser, Michael Waltl, Ben Kaczer, Bogdan Govoreanu:
Temperature Dependent Mismatch and Variability in a Cryo-CMOS Array with 30k Transistors. IRPS 2022: 10 - [c9]Kookjin Lee, Ben Kaczer, Anastasiia Kruv, Mario Gonzalez, Geert Eneman, Oguzhan O. Okudur, Alexander Grill, Jacopo Franco, Andrea Vici, Robin Degraeve, Ingrid De Wolf:
Significant Enhancement of HCD and TDDB in CMOS FETs by Mechanical Stress. IRPS 2022: 10 - [c8]Stanislav Tyaginov, Aryan Afzalian, Alexander Makarov, Alexander Grill, Michiel Vandemaele, Maksim Cherenev, Mikhail I. Vexler, Geert Hellings, Ben Kaczer:
On Superior Hot Carrier Robustness of Dynamically-Doped Field-Effect-Transistors. IRPS 2022: 11 - [c7]Rohith Acharya, Anton Potocnik
, Steven Brebels, Alexander Grill, Jeroen Verjauw, Tsvetan Ivanov, Daniel Perez Lozano, Danny Wan, Fahd A. Mohiyaddin, Jacques Van Damme, A. M. Vadiraj, Massimo Mongillo
, Georges G. E. Gielen, Francky Catthoor, Jan Craninckx, Iuliana P. Radu, Bogdan Govoreanu:
Scalable 1.4 μW cryo-CMOS SP4T multiplexer operating at 10 mK for high-fidelity superconducting qubit measurements. VLSI Technology and Circuits 2022: 230-231 - 2021
- [c6]Iuliana P. Radu, Roy Li, Anton Potocnik, Tsvetan Ivanov, Danny Wan, Stefan Kubicek, Nard I. Dumoulin Stuyck, Jeroen Verjauw, Julien Jussot, Yann Canvel, Clement Godfrin, Massimo Mongillo
, Rohith Acharya, Asser Elsayed, Mohamed Shehata, Xiaoyu Piao, Antoine Pacco, Laurent Souriau, Sebastien Couet, B. T. Chan, Jan Craninckx, Bertrand Parvais
, Alexander Grill, Subramanian Narasimhamoorthy, Steven Van Winckel, Steven Brebels, Fahd A. Mohiyaddin, George Simion, Bogdan Govoreanu:
Solid state qubits: how learning from CMOS fabrication can speed-up progress in Quantum Computing. VLSI Circuits 2021: 1-2 - 2020
- [c5]Alexander Grill, Erik Bury, Jakob Michl
, Stanislav Tyaginov, Dimitri Linten, Tibor Grasser, Bertrand Parvais
, Ben Kaczer, Michael Waltl
, Iuliana P. Radu
:
Reliability and Variability of Advanced CMOS Devices at Cryogenic Temperatures. IRPS 2020: 1-6 - [c4]Anastasiia Kruv, Ben Kaczer, Alexander Grill, Mario Gonzalez, Jacopo Franco, Dimitri Linten, Wolfgang Goes, Tibor Grasser, Ingrid De Wolf:
On the impact of mechanical stress on gate oxide trapping. IRPS 2020: 1-5 - [c3]Jakob Michl
, Alexander Grill, Dieter Claes, Gerhard Rzepa, Ben Kaczer, Dimitri Linten, Iuliana P. Radu
, Tibor Grasser, Michael Waltl
:
Quantum Mechanical Charge Trap Modeling to Explain BTI at Cryogenic Temperatures. IRPS 2020: 1-6 - [c2]Stanislav Tyaginov, Alexander Grill, Michiel Vandemaele, Tibor Grasser, Geert Hellings, Alexander Makarov, Markus Jech, Dimitri Linten, Ben Kaczer:
A Compact Physics Analytical Model for Hot-Carrier Degradation. IRPS 2020: 1-7
2010 – 2019
- 2019
- [c1]Alexander Makarov, Ben Kaczer, Philippe Roussel, Adrian Vaisman Chasin, Alexander Grill, Michiel Vandemaele, Geert Hellings, Al-Moatasem El-Sayed, Tibor Grasser, Dimitri Linten, Stanislav Tyaginov:
Modeling the Effect of Random Dopants on Hot-Carrier Degradation in FinFETs. IRPS 2019: 1-7
Coauthor Index
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last updated on 2024-08-05 20:22 CEST by the dblp team
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