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ORCIDDimitri Lederer
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2020 – today
- 2023
[c7]Youssef Bendou, Martin Rack, Dimitri Lederer, Andreia Cathelin, Jean-Pierre Raskin:
Substrate noise mitigation using high resistivity base silicon wafer for a 14 GHz VCO on 28 nm FD-SOI. NEWCAS 2023: 1-5- 2021
- [c6]Martin Rack, Lucas Nyssens, Quentin Courte, Dimitri Lederer, Jean-Pierre Raskin:
Impact of Device Shunt Loss on DC-80 GHz SPDT in 22 nm FD-SOI. ESSDERC 2021: 195-198 - [c5]Sameer H. Jain, Dimitri Lederer, Arvind Kumar, Sudesh Saroop, Chris Prindle, P. Srinivasan
, Wen Liu, Ravi Achanta, Erdem Kaltalioglu, Stephen Moss, Greg Freeman, Paul Colestock:
Novel mmWave NMOS Device for High Pout mmWave Power Amplifiers in 45RFSOI. ESSDERC 2021: 199-202 - [c4]Pieter Cardinael, Sachin Yadav, Ming Zhao, Martin Rack, Dimitri Lederer, Nadine Collaert, Bertrand Parvais, Jean-Pierre Raskin:
Impact of III-N buffer layers on RF losses and harmonic distortion of GaN-on-Si Substrates. ESSDERC 2021: 303-306 - [c3]Sachin Yadav, Pieter Cardinael, Ming Zhao, Komal Vondkar, Uthayasankaran Peralagu, AliReza Alian, Ahmad Khaled, Sergej Makovejev, Enrique Ekoga, Dimitri Lederer, Jean-Pierre Raskin, Bertrand Parvais, Nadine Collaert:
CMOS compatible GaN-on-Si HEMT technology for RF applications: analysis of substrate losses and non-linearities. ICICDT 2021: 1-4 - [c2]P. Srinivasan, Fernando Guarin, Shafi Syed, Joris Angelo Sundaram Jerome, Wen Liu, Sameer H. Jain, Dimitri Lederer, Stephen Moss, Paul Colestock, Anirban Bandyopadhyay, Ned Cahoon, Byoung Min, Martin Gall:
RF Reliability of SOI-based Power Amplifier FETs for mmWave 5G Applications. IRPS 2021: 1-6
2010 – 2019
- 2011
- [j1]C. Roda Neve, Valeria Kilchytska, Joaquín Alvarado, Dimitri Lederer, O. Militaru, Denis Flandre, Jean-Pierre Raskin:
Impact of neutron irradiation on the RF properties of oxidized high-resistivity silicon substrates with and without a trap-rich passivation layer. Microelectron. Reliab. 51(2): 326-331 (2011)
2000 – 2009
- 2003
- [c1]G. Laurent, Luis Moreno Hagelsieb, Dimitri Lederer, P. E. Lobert, Denis Flandre, J. Remacle, Jean-Pierre Raskin:
DNA electrical detection based on inductor resonance frequency in standard CMOS technology. ESSCIRC 2003: 337-340
Coauthor Index
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