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2020 – today
- 2025
[j8]Rui Chen
, Bin Gao, Guixin Qin, Chao Chang, Yukuan Kang, Hongjiang Ren, Diyuan Zou, Qiuping Ma, Wai Lok Woo:
Physical and Digital Dual-Driven AI Framework for Enhanced Electromagnetic Perception of Nondestructive Testing Tomography. IEEE Trans. Ind. Informatics 21(11): 8858-8869 (2025)- [j7]Qin Tang, Bin Gao, Qiuping Ma, Gaige Ru, Songwen Xue, Wenze Shi, Fei Luo, Wai Lok Woo:
Physical Coupling Fusion of Electromagnetic Acoustic Guided Wave With "Near-Zero" Magnetic Sensing System for Multitype Defect Detection. IEEE Trans. Instrum. Meas. 74: 1-11 (2025) - [j6]Changrong Yang, Gui-Yun Tian, Mark Robinson, Qiuping Ma, Lawal Umar Daura, Emmanuel Tashiwa Ibrahim:
Novel Impedance Sensing via Semiconductor Strain Gauge and Magnetic Resonant Coupling for Wireless Force Measurement. IEEE Trans. Instrum. Meas. 74: 1-14 (2025) - [j5]Changrong Yang, Gui-Yun Tian, Mark Robinson, Qiuping Ma, Lawal Umar Daura, Emmanuel Tashiwa Ibrahim:
Corrections to "Novel Impedance Sensing via Semiconductor Strain Gauge and Magnetic Resonant Coupling for Wireless Force Measurement". IEEE Trans. Instrum. Meas. 74: 1 (2025) - [c1]Qiuping Ma, Jiaqi Zhou, Xumei Yang, Chao Chang, Rui Chen, Qin Tang, Zhaohu Yu, Bin Gao, Guiyun Tian:
Enhanced High-Sensitivity Eddy Current Technology for In-Line Pipeline Inspection and Imaging with Superior Resolution. I2MTC 2025: 1-6 - 2024
- [j4]Qiuping Ma, Hongyan Li:
A decision support system for supplier quality evaluation based on MCDM-aggregation and machine learning. Expert Syst. Appl. 242: 122746 (2024) - 2023
- [j3]Gaige Ru, Bin Gao, Dong Liu, Qiuping Ma, Haoran Li, Wai Lok Woo:
Structural Coupled Electromagnetic Sensing of Defects Diagnostic System. IEEE Trans. Ind. Electron. 70(1): 951-964 (2023) - 2022
- [j2]Dong Liu, Hong Zhang, Xiaoting Xiao, Qiuping Ma, Haoran Li, Guiyun Tian, Bin Gao, Jianbo Wu:
RLC Parameters Measurement and Fusion for High-Sensitivity Inductive Sensors. IEEE Trans. Instrum. Meas. 71: 1-11 (2022) - 2021
- [j1]Qiuping Ma, Hongyan Li, Anders Thorstenson:
A big data-driven root cause analysis system: Application of Machine Learning in quality problem solving. Comput. Ind. Eng. 160: 107580 (2021)
Coauthor Index
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