Wafer map defect classification using deep learning framework with data augmentation on imbalance datasets.

Mon, 01 Dec 2025 00:00:00 +0100

Tsung-Han Tsai , Chieng-Yang Wang:
Wafer map defect classification using deep learning framework with data augmentation on imbalance datasets. EURASIP J. Image Video Process. 2025(1): 6 (2025)