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Francesco Angione
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2020 – today
- 2024
- [c8]Denis Schwachhofer, Francesco Angione, Steffen Becker, Stefan Wagner, Matthias Sauer, Paolo Bernardi, Ilia Polian:
Optimizing System-Level Test Program Generation via Genetic Programming. ETS 2024: 1-4 - 2023
- [j2]Francesco Angione, Davide Appello, Paolo Bernardi, Andrea Calabrese, Stefano Quer, Matteo Sonza Reorda, Vincenzo Tancorre, Roberto Ugioli:
A Toolchain to Quantify Burn-In Stress Effectiveness on Large Automotive System-on-Chips. IEEE Access 11: 105655-105676 (2023) - [j1]Francesco Angione, Davide Appello, Paolo Bernardi, Claudia Bertani, Giovambattista Gallo, Stefano Littardi, Giorgio Pollaccia, Walter Ruggeri, Matteo Sonza Reorda, Vincenzo Tancorre, Roberto Ugioli:
A Low-Cost Burn-In Tester Architecture to Supply Effective Electrical Stress. IEEE Trans. Computers 72(5): 1447-1459 (2023) - [c7]Francesco Angione, Paolo Bernardi, Riccardo Cantoro, Nicola Di Gruttola Giardino, Davide Piumatti, Matteo Sonza Reorda, Davide Appello, Vincenzo Tancorre:
On the integration and hardening of Software Test Libraries in Real-Time Operating Systems. LATS 2023: 1-6 - [c6]Francesco Angione, Paolo Bernardi, Nicola Di Gruttola Giardino, Davide Appello, Claudia Bertani, Vincenzo Tancorre:
A guided debugger-based fault injection methodology for assessing functional test programs. VTS 2023: 1-7 - 2022
- [c5]Francesco Angione, Paolo Bernardi, Gabriele Filipponi, Claudia Tempesta, Matteo Sonza Reorda, Davide Appello, Vincenzo Tancorre, Roberto Ugioli:
Online scheduling of concurrent Memory BISTs execution at Real-Time Operating-System level. DFT 2022: 1-6 - [c4]Francesco Angione, Davide Appello, J. Aribido, Jyotika Athavale, Nicolò Bellarmino, Paolo Bernardi, Riccardo Cantoro, Corrado De Sio, Tommaso Foscale, Gabriele Gavarini, J. Guerrero, Martin Huch, Giusy Iaria, Tobias Kilian, Riccardo Mariani, Raffaele Martone, Annachiara Ruospo, Ernesto Sánchez, Ulf Schlichtmann, Giovanni Squillero, Matteo Sonza Reorda, Luca Sterpone, Vincenzo Tancorre, Roberto Ugioli:
Test, Reliability and Functional Safety Trends for Automotive System-on-Chip. ETS 2022: 1-10 - [c3]Francesco Angione, Paolo Bernardi, Gabriele Filipponi, Matteo Sonza Reorda, Davide Appello, Vincenzo Tancorre, Roberto Ugioli:
An Optimized Burn-In Stress Flow targeting Interconnections logic to Embedded Memories in Automotive Systems-on-Chip. ETS 2022: 1-6 - [c2]Francesco Angione, Paolo Bernardi, Andrea Calabrese, Lorenzo Cardone, A. Niccoletti, Davide Piumatti, Stefano Quer, Davide Appello, Vincenzo Tancorre, Roberto Ugioli:
An innovative Strategy to Quickly Grade Functional Test Programs. ITC 2022: 355-364 - [c1]Giusy Iaria, Francesco Angione, Paolo Bernardi, Matteo Sonza Reorda, Davide Appello, Giuseppe Garozzo, Vincenzo Tancorre:
A novel Pattern Selection Algorithm to reduce the Test Cost of large Automotive Systems-on-Chip. LATS 2022: 1-6
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