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Y. Tatsumi

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2000 – 2009

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2001
[c1]
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Shizunori Matsumoto, Hans Jürgen Mattausch, S. Ooshiro, Y. Tatsumi, Mitiko Miura-Mattausch, Shigetaka Kumashiro, Terufumi Yamaguchi, Kyoji Yamashita, Noriaki Nakayama:
Test-circuit-based extraction of inter- and intra-chip MOSFET-performance variations for analog-design reliability. CICC 2001: 357-360

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