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A. Petitqueux

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2000 – 2009

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2003
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Marie-Lise Flottes, Christian Landrault, A. Petitqueux:
A Unified DFT Approach for BIST and External Test. J. Electron. Test. 19(1): 49-60 (2003)
2000
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Marie-Lise Flottes, Christian Landrault, A. Petitqueux:
Design for sequential testability: an internal state reseeding approach for 100 % fault coverage. Asian Test Symposium 2000: 404-

1990 – 1999

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1999
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Marie-Lise Flottes, Christian Landrault, A. Petitqueux:
Partial set for flip-flops based on state requirement for non-scan BIST scheme. ETW 1999: 104-109

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