Advanced fault diagnosis in analog and digital VLSI circuits utilizing multi-anchor space-aware temporal convolutional neural network for efficient circuit reliability assessment.

Thu, 01 Jan 2026 00:00:00 +0100

Divya Arivalagan, O. Vignesh, S. S. Abinayaa, V. S. Nishok:
Advanced fault diagnosis in analog and digital VLSI circuits utilizing multi-anchor space-aware temporal convolutional neural network for efficient circuit reliability assessment. Integr. 107: 102631 (2026)