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Hozan Miro

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2011
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Rene Kregting, Sander Gielen, Willem D. van Driel, Paul Alkemade, Hozan Miro, Jan-Dirk Kamminga:
Local stress analysis on semiconductor devices by combined experimental-numerical procedure. Microelectron. Reliab. 51(6): 1092-1096 (2011)

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