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R. M. C. B. Ratnayake

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2007
[c1]
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  - electronic edition @ u-tokyo.ac.jp (open access)
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  - conf/mva/RatnayakeHA07
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R. M. C. B. Ratnayake, Craig Hicks, M. A. Akbari:
A SVM Based Method to Detect Color Shift Defects in IC Packages. MVA 2007: 138-141

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