Application-based Modeling of I/O Reliability.

Wed, 01 Jan 2025 00:00:00 +0100

M. D. Shroff, J. Satasia, C. Lu, K. Xie, Z. Y. Liu, L. Zhang, R. Peng, J. Jiang, W. Zhao, G. Liu, R. Pavlanin, S. Kala-Janssen, R. Ye, H. Sanchez, D. Bearden, C. Le Cam, A. Patel, C. Magnella, C. Richards-Chacon:
Application-based Modeling of I/O Reliability. IRPS 2025: 1-6