Characteristics degradation of the SiGe HBT under electromagnetic field stress.

Fri, 01 Jan 2010 00:00:00 +0100

Ali Alaeddine, Moncef Kadi, Kaouther Daoud, B. Beydoun:
Characteristics degradation of the SiGe HBT under electromagnetic field stress. Microelectron. Reliab. 50(12): 1961-1966 (2010)