SiMiC: Context-Aware Silicon Microstructure Characterization Using Attention-Based Convolutional Neural Networks for Field-Emission Tip Analysis.

Thu, 01 Jan 2026 00:00:00 +0100

Jing Jie Tan , Rupert Schreiner, Matthias Hausladen, Ali Asgharzade, Simon Edler, Julian Bartsch, Michael Bachmann, Andreas Schels, Ban-Hoe Kwan, Danny Wee-Kiat Ng, Yan Chai Hum:
SiMiC: Context-Aware Silicon Microstructure Characterization Using Attention-Based Convolutional Neural Networks for Field-Emission Tip Analysis. CoRR abs/2601.17048 (2026)