BibTeX records: S. Kubicek

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@inproceedings{DBLP:conf/essderc/ChiarellaKRRHEK16,
  author    = {Thomas Chiarella and
               S. Kubicek and
               E. Rosseel and
               Romain Ritzenthaler and
               Andriy Hikavyy and
               P. Eyben and
               A. De Keersgieter and
               L.{-}{\AA}. Ragnarsson and
               M.{-}S. Kim and
               S.{-}A. Chew and
               Tom Schram and
               S. Demuynck and
               Miroslav Cup{\'{a}}k and
               Luc Rijnders and
               Morin Dehan and
               Naoto Horiguchi and
               J{\'{e}}r{\^{o}}me Mitard and
               Dan Mocuta and
               Anda Mocuta and
               Aaron Voon{-}Yew Thean},
  title     = {Towards high performance sub-10nm finW bulk FinFET technology},
  booktitle = {46th European Solid-State Device Research Conference, {ESSDERC} 2016,
               Lausanne, Switzerland, September 12-15, 2016},
  pages     = {131--134},
  publisher = {{IEEE}},
  year      = {2016},
  url       = {https://doi.org/10.1109/ESSDERC.2016.7599605},
  doi       = {10.1109/ESSDERC.2016.7599605},
  timestamp = {Wed, 16 Oct 2019 14:14:50 +0200},
  biburl    = {https://dblp.org/rec/conf/essderc/ChiarellaKRRHEK16.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/esscirc/ChiarellaWMKDRO09,
  author    = {Thomas Chiarella and
               Liesbeth Witters and
               Abdelkarim Mercha and
               Christoph Kerner and
               Rok Dittrich and
               Michal Rakowski and
               Claude Ortolland and
               Lars{-}{\AA}ke Ragnarsson and
               Bertrand Parvais and
               A. De Keersgieter and
               S. Kubicek and
               A. Redolfi and
               R. Rooyackers and
               C. Vrancken and
               S. Brus and
               A. Lauwers and
               Philippe Absil and
               S. Biesemans and
               Thomas Y. Hoffmann},
  title     = {Migrating from planar to FinFET for further {CMOS} scaling: {SOI}
               or bulk?},
  booktitle = {35th European Solid-State Circuits Conference, {ESSCIRC} 2009, Athens,
               Greece, 14-18 September 2009},
  pages     = {84--87},
  publisher = {{IEEE}},
  year      = {2009},
  url       = {https://doi.org/10.1109/ESSCIRC.2009.5325993},
  doi       = {10.1109/ESSCIRC.2009.5325993},
  timestamp = {Mon, 22 Feb 2021 00:00:00 +0100},
  biburl    = {https://dblp.org/rec/conf/esscirc/ChiarellaWMKDRO09.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LujanMRKGHM05,
  author    = {G. S. Lujan and
               Wim Magnus and
               L.{-}{\AA}. Ragnarsson and
               S. Kubicek and
               Stefan De Gendt and
               Marc M. Heyns and
               Kristin De Meyer},
  title     = {Modelling mobility degradation due to remote Coulomb scattering from
               dielectric charges and its impact on {MOS} device performance},
  journal   = {Microelectron. Reliab.},
  volume    = {45},
  number    = {5-6},
  pages     = {794--797},
  year      = {2005},
  url       = {https://doi.org/10.1016/j.microrel.2004.11.046},
  doi       = {10.1016/j.microrel.2004.11.046},
  timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl    = {https://dblp.org/rec/journals/mr/LujanMRKGHM05.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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