Numerical and Experimental Analysis of Potential Causes Degrading Contact Resistances and Forces of Sensor Connectors for Vehicles.

Tue, 01 Jan 2019 00:00:00 +0100

Jangmuk Lim, Hansu Kim , Jae Kyun Kim, Sung Joon Park, Tae Hee Lee, Sang Won Yoon :
Numerical and Experimental Analysis of Potential Causes Degrading Contact Resistances and Forces of Sensor Connectors for Vehicles. IEEE Access 7: 126530-126538 (2019)