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I. Batyrev

I. G. Batyrev

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2000 – 2009

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2009
[c1]
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  dblp key:
  - conf/esscirc/PantelidesTBRHB09
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  - https://dblp.org/rec/conf/esscirc/PantelidesTBRHB09
Sokrates T. Pantelides, L. Tsetseris, M. J. Beck, Sergey N. Rashkeev, G. Hadjisavvas, I. G. Batyrev, B. R. Tuttle, A. G. Marinopoulos, X. J. Zhou, Daniel M. Fleetwood, Ronald D. Schrimpf:
Performance, reliability, radiation effects, and aging issues in microelectronics - from atomic-scale physics to engineering-level modeling. ESSCIRC 2009: 76-83
2007
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  - journals/mr/FleetwoodRTZBWSP07
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Daniel M. Fleetwood, M. P. Rodgers, L. Tsetseris, X. J. Zhou, I. Batyrev, S. Wang, Ronald D. Schrimpf, Sokrates T. Pantelides:
Effects of device aging on microelectronics radiation response and reliability. Microelectron. Reliab. 47(7): 1075-1085 (2007)

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