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Ken-ichiro Tatsuuma

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2005
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Toshihiro Matsuda, Hiroaki Takeuchi, Akira Muramatsu, Hideyuki Iwata, Takashi Ohzone, Kyoji Yamashita, Norio Koike, Ken-ichiro Tatsuuma:
A Test Structure for Two-Dimensional Analysis of MOSFETs by Hot-Carrier-Induced Photoemission. IEICE Trans. Electron. 88-C(5): 811-816 (2005)

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