Failure analysis of ESD-stressed SiC MESFET.

Thu, 01 Jan 2015 00:00:00 +0100

Tanguy Phulpin, David Trémouilles , Karine Isoird , Dominique Tournier, Philippe Godignon , Patrick Austin:
Failure analysis of ESD-stressed SiC MESFET. Microelectron. Reliab. 55(9-10): 1542-1548 (2015)