Analysis of an ESD failure mechanism on a SiC MESFET.

Wed, 01 Jan 2014 00:00:00 +0100

Tanguy Phulpin, David Trémouilles , Karine Isoird , Dominique Tournier, Philippe Godignon , Patrick Austin:
Analysis of an ESD failure mechanism on a SiC MESFET. Microelectron. Reliab. 54(9-10): 2217-2221 (2014)