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J. T. Jang

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2006
[j1]
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J. T. Jang, Y. C. Kim, W. H. Bong, E. K. Kwon, B. J. Kwon, J. S. Jeon, H. G. Kim, I. H. Son:
A new high-voltage tolerant I/O for improving ESD robustness. Microelectron. Reliab. 46(9-11): 1634-1637 (2006)

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