A Silicon-Based Yiel Gain Evaluation Methodology for Embedded-SRAMs with Different Redundancy Scenarios.

Tue, 01 Jan 2002 00:00:00 +0100

Emmanuel Rondey, Yann Tellier, Simone Borri:
A Silicon-Based Yiel Gain Evaluation Methodology for Embedded-SRAMs with Different Redundancy Scenarios. IOLTW 2002: 251-255