Ultra-thick gate oxides: charge generation and its impact on reliability.

Mon, 01 Jan 2001 00:00:00 +0100

Udo Schwalke, Martin Pölzl, Thomas Sekinger, Martin Kerber:
Ultra-thick gate oxides: charge generation and its impact on reliability. Microelectron. Reliab. 41(7): 1007-1010 (2001)